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Authors: | Matthias Woehrle, Kai Lampka, Lothar Thiele |
Group: | Computer Engineering |
Type: | Inproceedings |
Title: | Exploiting timed automata for conformance testing of power measurements |
Year: | 2009 |
Month: | September |
Pub-Key: | wlt2009 |
Book Titel: | Proc. Formal Modeling and Analysis of Timed Systems 2009 |
Pages: | 275-290 |
Keywords: | SN, Uppaal, power trace |
Publisher: | Springer |
Resources: | [BibTeX] [Paper as PDF] |